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  • Authors: Justino C.I.L., Rocha-Santos T.A.P., Amaral J.P., Cardoso S., Duarte A.C.
  • Title: Effects of geometry parameters of NTFET devices on the I-V measurements
  • Source: Solid State Electronics
  • Year Published: 2013
  • Volume: 81
  • Unique Article Identifier: ISI WOS

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